Stefan Meyer Institute, Austria
Highly charged ions (HCI) are ubiquitous in the universe, and therefore play a vital role in astronomy. Light emitted from HCI in the visible as well in the x-ray regime provide important information for studying astronomical objects. Electron beam ion traps (EBIT) have been proven to be a versatile tool to study HCI.
In my talk, I will present spectroscopy experiments on HCI produced and trapped EBITS, from laser spectroscopy in the visible up to x-ray spectroscopy, using state-of-the-art XFEL x-ray sources.